DocumentCode :
2158731
Title :
Robust Lp-norm metric for BICM-OFDM cognitive radio systems
Author :
Nasri, Amir ; Schober, Robert
Author_Institution :
Univ. of British Columbia, Vancouver, BC
fYear :
2009
fDate :
3-6 May 2009
Firstpage :
359
Lastpage :
362
Abstract :
Cognitive radio (CR) systems make efficient use of the frequency spectrum by opportunistically exploiting unoccupied or under-utilized frequency bands. However, the frequency bands used by CR systems are expected to suffer from various forms of noise and interference with non-Gaussian distributions, such as narrowband and co-channel interference caused by the primary user and other CRs, respectively, and man-made impulsive noise. To mitigate the harmful effects of non-Gaussian noise and interference, we propose a robust Lp-norm metric for CR systems that employ the popular combination of bit-interleaved coded modulation (BICM) and orthogonal frequency division multiplexing (OFDM). For the considered CR system we provide an approximate upper bound and an asymptotic closed-form approximation for the bit error rate (BER). Our results show that the proposed Lp-norm metric can achieve large performance gains compared to the conventional L2-norm metric in non-Gaussian noise and interference.
Keywords :
Gaussian distribution; Gaussian noise; OFDM modulation; cognitive radio; error statistics; interleaved codes; BER; Lp-norm metric; OFDM; asymptotic closed-form approximation; bit error rate; bit-interleaved coded modulation; cochannel interference; cognitive radio systems; frequency spectrum; man-made impulsive noise; nonGaussian distributions; nonGaussian interference; nonGaussian noise; orthogonal frequency division multiplexing; under-utilized frequency bands; Bit error rate; Chromium; Cognitive radio; Interchannel interference; Interleaved codes; Modulation coding; Narrowband; Noise robustness; OFDM modulation; Upper bound;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Computer Engineering, 2009. CCECE '09. Canadian Conference on
Conference_Location :
St. John´s, NL
ISSN :
0840-7789
Print_ISBN :
978-1-4244-3509-8
Electronic_ISBN :
0840-7789
Type :
conf
DOI :
10.1109/CCECE.2009.5090154
Filename :
5090154
Link To Document :
بازگشت