Title :
Variation and analog modeling
Author :
McConaghy, Trent ; Chen, Brian
Abstract :
AMS, RF, and memory circuits can be highly susceptible to performance degradation caused by process variation, thermal noise, and other non-idealities. This session presents recent advances in modeling these effects, gaining insight into their operation, and techniques to mitigate them.
Keywords :
CMOS integrated circuits; Integrated circuit modeling; MOSFET; Noise; Radio frequency; Semiconductor device modeling; Thermal noise;
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2013 IEEE
Conference_Location :
San Jose, CA, USA
DOI :
10.1109/CICC.2013.6658560
