• DocumentCode
    2159016
  • Title

    The role of spacer surface conditions in the scatter of charge accumulations in SF6

  • Author

    Jing, T. ; Morshuis, P.H.F. ; Kreuger, F.H.

  • Author_Institution
    Inst. of Stand. & Ind. Res., Singapore
  • Volume
    1
  • fYear
    1994
  • fDate
    3-8 Jul 1994
  • Firstpage
    274
  • Abstract
    A cylindrical epoxy spacer with different surface roughnesses was stressed under +150 kV in SF6. It is found that artificial roughness has no significant influence on the charge accumulation. Influences come from the variation in the surface conditions of the spacer by roughening it artificially. An additional test also shows that the micro structure at the spacer surface is more responsible for the large scatter of charge accumulation than that at the electrodes
  • Keywords
    Charge measurement; Dielectrics; Electrodes; Flashover; Permittivity; Rough surfaces; Scattering; Surface roughness; Surface treatment; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 1994., Proceedings of the 4th International Conference on
  • Conference_Location
    Brisbane, Qld.
  • Print_ISBN
    0-7803-1307-0
  • Type

    conf

  • DOI
    10.1109/ICPADM.1994.413992
  • Filename
    413992
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2159016