• DocumentCode
    2159172
  • Title

    Design consideration of closely spaced polarization-and pattern-diversity antenna pair

  • Author

    Lai, Chien-Pai ; Chen, Shih-Yuan ; Li, Hsueh-Jyh

  • Author_Institution
    Grad. Inst. of Commun. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2012
  • fDate
    8-14 July 2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Design consideration of a closely spaced antenna pair with polarization and pattern diversity is presented in this paper. Mutual coupling between the antennas causes pattern distortion and increases cross polarization, and thus it degrades the pattern and polarization diversity and increases the envelope correlation. Two configurations of antenna pair are proposed to examine their mutual coupling and envelope correlation. Each configuration is composed of two perpendicular electrical and magnetic dipoles because, theoretically, it should have higher polarization and pattern diversity. Using two noted formulas of envelope correlation for both configurations, it is found that the values calculated by the two formulas for the same configuration may differ significantly when the antenna pair has larger mutual coupling and cross polarization. Although the calculation of envelope correlation via S-parameters is more time-saving, it is necessary to check the other formula via pattern integration when noticeable amount of mutual coupling exists in a closely spaced antenna pair.
  • Keywords
    S-parameters; antenna arrays; antenna radiation patterns; electromagnetic wave polarisation; S-parameters; closely-spaced antenna pair; cross polarization; design consideration; envelope correlation; mutual coupling; pattern distortion; pattern diversity; pattern integration; polarization diversity; two-perpendicular electrical-magnetic dipoles; Antenna radiation patterns; Correlation; Dipole antennas; Mutual coupling; Slot antennas;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium (APSURSI), 2012 IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1522-3965
  • Print_ISBN
    978-1-4673-0461-0
  • Type

    conf

  • DOI
    10.1109/APS.2012.6349236
  • Filename
    6349236