Title :
Dielectric properties and microstructure of (Sr.Ca)TiO3-based boundary layer capacitor materials
Author :
Choi, Woon Shik ; Kim, Chung Hyeok ; Lee, Joon Ung ; Choon-Bae Park ; Lee, Sung Ill
Author_Institution :
Dept. of Electr. Eng., Kwangwoon Univ., Seoul, South Korea
Abstract :
The dielectric properties and the microstructure of (Sr.Ca)TiO3-based boundary layer (BL) capacitor materials were investigated. (Sr.Ca)TiO3-based compositions were fired at 1350°C in a N2 atmosphere to get the base semiconducting ceramics. The metal oxides of CuO were printed on the semiconducting ceramics and fired at 1200°C for the subsequent grain boundary diffusion. The grain size of the semiconducting ceramics was 20~40 μm and the apparent permittivity of the resulting material varied between 2×104 and 3×104
Keywords :
Atmosphere; Capacitors; Ceramics; Composite materials; Dielectric materials; Grain boundaries; Grain size; Microstructure; Semiconductivity; Semiconductor materials;
Conference_Titel :
Properties and Applications of Dielectric Materials, 1994., Proceedings of the 4th International Conference on
Conference_Location :
Brisbane, Qld.
Print_ISBN :
0-7803-1307-0
DOI :
10.1109/ICPADM.1994.413995
