Title :
Emerging technologies for electronic design and test
Author :
Agrawal, Rathima
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ, USA
Abstract :
The need for tight coupling between methodologies for design-and-test, VLSI technology, architecture and CAD has never been as strong as it is today. The design and test challenges of today are due to the sudden demand for systems that deal with multimedia, high speed networking and computing, and wireless communications, to name a few. The competitive nature of these businesses puts enormous pressure on electronic system and integrated circuit designers and test engineers to deliver reliable and complex systems with very short design intervals. Extremely large scales of integration, very high operating speeds and the proliferation of analog or mixed analog-digital designs have given rise to new problems of design verification, testing and packaging technologies
Keywords :
VLSI; circuit CAD; computer architecture; design for testability; integrated circuit testing; mixed analogue-digital integrated circuits; packaging; CAD; VLSI technology; analog designs; architecture; competition; computer-aided design; design intervals; design verification; electronic design and test; emerging technologies; high speed computing; high speed networking; integrated circuit design; integrated circuit testing; large scale integration; mixed analog-digital designs; multimedia; operating speeds; packaging technologies; reliable systems; wireless communications; Circuit testing; Computer networks; Design automation; Design methodology; Electronic equipment testing; High-speed networks; Multimedia computing; Multimedia systems; System testing; Very large scale integration;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1994. ICCD '94. Proceedings., IEEE International Conference on
Conference_Location :
Cambridge, MA
Print_ISBN :
0-8186-6565-3
DOI :
10.1109/ICCD.1994.331844
