• DocumentCode
    2160195
  • Title

    Limitations to the size of single-chip electronic neural networks

  • Author

    Feltham, Derek B I ; Maly, Wojciech

  • Author_Institution
    Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    1991
  • fDate
    29-31 Jan 1991
  • Firstpage
    61
  • Lastpage
    67
  • Abstract
    The authors analyze and quantify the design tradeoffs which will limit the size of single-chip analog neural networks implemented using standard CMOS technology. Issues investigated include the limits imposed by the neural network architectures themselves, and the related effects of processing variations and defects on the ultimate size of manufacturable neural systems. It is shown that neural networks, even if potentially fault-tolerant, will not automatically provide the capability to make limitless large single-chip integrated circuits
  • Keywords
    CMOS integrated circuits; neural nets; analog neural networks; design tradeoffs; fault-tolerant; neural network architectures; processing variations; single-chip electronic neural networks; size; standard CMOS technology; CMOS technology; Circuits; Fabrication; Fault tolerance; Feedforward neural networks; Mathematical model; Neural networks; Neurons; Pulp manufacturing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wafer Scale Integration, 1991. Proceedings., [3rd] International Conference on
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-8186-9126-3
  • Type

    conf

  • DOI
    10.1109/ICWSI.1991.151697
  • Filename
    151697