• DocumentCode
    2160319
  • Title

    Behavioral synthesis for hierarchical testability of controller/data path circuits with conditional branches

  • Author

    Bhatia, Sandeep ; Jha, Niraj K.

  • Author_Institution
    Dept. of Electr. Eng., Princeton Univ., NJ, USA
  • fYear
    1994
  • fDate
    10-12 Oct 1994
  • Firstpage
    91
  • Lastpage
    96
  • Abstract
    Most existing behavioral synthesis systems put emphasis on optimizing area and performance. Only recently has some research been done to consider testability during behavioral synthesis. In our previous work, we integrated hierarchical testability with behavioral synthesis of simple digital data path circuits to synthesize highly testable circuits (S. Bhatia and N.K. Jha, 1994). In the current work, we consider the testability of complete controller and data path during behavioral synthesis. The methods presented can easily handle large and complex behavioral descriptions with loops, conditionals, and allow different scheduling constructs, such as pipelining, multicycling, and chaining. The test set for the combined controller/data path is generated during synthesis in a very short time and near 100% fault coverage is obtained for almost all the synthesized circuits at practically zero overheads
  • Keywords
    circuit CAD; design for testability; graph theory; network synthesis; scheduling; behavioral descriptions; behavioral synthesis; chaining; combined controller/data path; conditional branches; controller/data path circuits; fault coverage; hierarchical testability; highly testable circuits; multicycling; pipelining; scheduling constructs; simple digital data path circuits; synthesized circuits; test set; testability; Built-in self-test; Circuit faults; Circuit synthesis; Circuit testing; Control system synthesis; Delay; Digital circuits; Integrated circuit synthesis; Pipeline processing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design: VLSI in Computers and Processors, 1994. ICCD '94. Proceedings., IEEE International Conference on
  • Conference_Location
    Cambridge, MA
  • Print_ISBN
    0-8186-6565-3
  • Type

    conf

  • DOI
    10.1109/ICCD.1994.331862
  • Filename
    331862