• DocumentCode
    2160442
  • Title

    Phase characterization of two-tone intermodulation distortion

  • Author

    Crespo-Cadenas, C. ; Reina-Tosina, J. ; Madero-Ayora, M.J.

  • Author_Institution
    Escuela Superior de Ingenieros, Seville Univ., Spain
  • fYear
    2005
  • fDate
    12-17 June 2005
  • Abstract
    An automated setup for the characterization of phase asymmetries in nonlinear microwave circuits under two-tone excitation is presented. The method includes a novel approach to generate two synchronized tones with the same amplitude and phase using an arbitrary-waveform signal generator. Special attention is devoted to the evaluation of two-tone IMD impairments as a consequence of memory effects and assesses its dependence on their separation in frequency. Experimental results over a HEMT amplifier exhibiting phase asymmetries are compared with standard two-tone measurements and show that the accuracy of this procedure is good, with negligible non-systematic errors.
  • Keywords
    Volterra series; intermodulation distortion; microwave circuits; nonlinear network analysis; synchronisation; waveform generators; HEMT amplifier; Volterra series; amplifier distortion; arbitrary-waveform signal generator; electrical memory effects; nonlinear microwave circuits; phase asymmetries; phase characterization; synchronized tones; two-tone excitation; two-tone intermodulation distortion; two-tone measurements; Distortion measurement; FETs; Frequency synchronization; HEMTs; Intermodulation distortion; Measurement standards; Microwave circuits; Phase measurement; Signal analysis; Signal generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2005 IEEE MTT-S International
  • ISSN
    01490-645X
  • Print_ISBN
    0-7803-8845-3
  • Type

    conf

  • DOI
    10.1109/MWSYM.2005.1516979
  • Filename
    1516979