DocumentCode :
2160442
Title :
Phase characterization of two-tone intermodulation distortion
Author :
Crespo-Cadenas, C. ; Reina-Tosina, J. ; Madero-Ayora, M.J.
Author_Institution :
Escuela Superior de Ingenieros, Seville Univ., Spain
fYear :
2005
fDate :
12-17 June 2005
Abstract :
An automated setup for the characterization of phase asymmetries in nonlinear microwave circuits under two-tone excitation is presented. The method includes a novel approach to generate two synchronized tones with the same amplitude and phase using an arbitrary-waveform signal generator. Special attention is devoted to the evaluation of two-tone IMD impairments as a consequence of memory effects and assesses its dependence on their separation in frequency. Experimental results over a HEMT amplifier exhibiting phase asymmetries are compared with standard two-tone measurements and show that the accuracy of this procedure is good, with negligible non-systematic errors.
Keywords :
Volterra series; intermodulation distortion; microwave circuits; nonlinear network analysis; synchronisation; waveform generators; HEMT amplifier; Volterra series; amplifier distortion; arbitrary-waveform signal generator; electrical memory effects; nonlinear microwave circuits; phase asymmetries; phase characterization; synchronized tones; two-tone excitation; two-tone intermodulation distortion; two-tone measurements; Distortion measurement; FETs; Frequency synchronization; HEMTs; Intermodulation distortion; Measurement standards; Microwave circuits; Phase measurement; Signal analysis; Signal generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2005 IEEE MTT-S International
ISSN :
01490-645X
Print_ISBN :
0-7803-8845-3
Type :
conf
DOI :
10.1109/MWSYM.2005.1516979
Filename :
1516979
Link To Document :
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