DocumentCode :
2160485
Title :
Investigation on ESD EMP damage effects of electronic components
Author :
Tan, Z.L. ; Xiang, Z.Y. ; Xu, B. ; Xie, P.H.
Author_Institution :
Inst. of Electrostatic & Electromagn. Protection, Mech. Eng. Coll., Shijiazhuang, China
fYear :
2009
fDate :
16-20 Sept. 2009
Firstpage :
89
Lastpage :
92
Abstract :
5 types of analogue or digital integrated circuits(IC) were selected as devices under test (DUT). The test results have shown that there were different electromagnetic pulse (EMP) sensitivities among different types of ICs. The average damage voltage of operation amplifier was below 5 kV The average damage voltage of LF156 caused by EMP was three times higher than that of BG305. For 54 or 74 series of ICs, the average EMP damage voltage was between 8.5~30 kV Because of multi-input or multi-output ends of IC chips, there were several current paths and each path was formed by different devices. Usually three types of end paths were classified such as input-to-ground, output-to-ground and source-to-ground. It had been shown that input or output ends were the sensetivest ones and the source end was the un-sensetivest one. The average EMP damage voltages of 54 or 74 series of ICs were 20~30 kV,15~20 kV and 8.5~13.5 kV when EMP current was injected from suorce, input and output ends respectively.
Keywords :
electromagnetic pulse; electrostatic discharge; operational amplifiers; radiation effects; ESD EMP damage effects; devices under test; electromagnetic pulse sensitivities; electronic components; Biological system modeling; Circuit testing; EMP radiation effects; Electronic components; Electrostatic discharge; Instruments; Integrated circuit testing; Operational amplifiers; Pins; Voltage; EMP; ESD; IC; damage voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Environmental Electromagnetics, 2009. CEEM 2009. 5th Asia-Pacific Conference on
Conference_Location :
Xian
Print_ISBN :
978-1-4244-4344-4
Type :
conf
DOI :
10.1109/CEEM.2009.5304291
Filename :
5304291
Link To Document :
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