• DocumentCode
    2160485
  • Title

    Investigation on ESD EMP damage effects of electronic components

  • Author

    Tan, Z.L. ; Xiang, Z.Y. ; Xu, B. ; Xie, P.H.

  • Author_Institution
    Inst. of Electrostatic & Electromagn. Protection, Mech. Eng. Coll., Shijiazhuang, China
  • fYear
    2009
  • fDate
    16-20 Sept. 2009
  • Firstpage
    89
  • Lastpage
    92
  • Abstract
    5 types of analogue or digital integrated circuits(IC) were selected as devices under test (DUT). The test results have shown that there were different electromagnetic pulse (EMP) sensitivities among different types of ICs. The average damage voltage of operation amplifier was below 5 kV The average damage voltage of LF156 caused by EMP was three times higher than that of BG305. For 54 or 74 series of ICs, the average EMP damage voltage was between 8.5~30 kV Because of multi-input or multi-output ends of IC chips, there were several current paths and each path was formed by different devices. Usually three types of end paths were classified such as input-to-ground, output-to-ground and source-to-ground. It had been shown that input or output ends were the sensetivest ones and the source end was the un-sensetivest one. The average EMP damage voltages of 54 or 74 series of ICs were 20~30 kV,15~20 kV and 8.5~13.5 kV when EMP current was injected from suorce, input and output ends respectively.
  • Keywords
    electromagnetic pulse; electrostatic discharge; operational amplifiers; radiation effects; ESD EMP damage effects; devices under test; electromagnetic pulse sensitivities; electronic components; Biological system modeling; Circuit testing; EMP radiation effects; Electronic components; Electrostatic discharge; Instruments; Integrated circuit testing; Operational amplifiers; Pins; Voltage; EMP; ESD; IC; damage voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Environmental Electromagnetics, 2009. CEEM 2009. 5th Asia-Pacific Conference on
  • Conference_Location
    Xian
  • Print_ISBN
    978-1-4244-4344-4
  • Type

    conf

  • DOI
    10.1109/CEEM.2009.5304291
  • Filename
    5304291