• DocumentCode
    2160601
  • Title

    Efficient timing analysis for CMOS circuit considering data dependent delays

  • Author

    Sun, Shang-Zhi ; Du, David H C ; Chen, Hsi-Chuan

  • Author_Institution
    Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA
  • fYear
    1994
  • fDate
    10-12 Oct 1994
  • Firstpage
    156
  • Lastpage
    159
  • Abstract
    Both long and short path delays are used to determine the valid clocking for various CMOS circuits such as single phase latching, asynchronous and wave pipelining. Therefore, accurate estimation of both long and short path delays is very crucial in the designing and testing of high speed CMOS circuits. Most of the previous approaches in detecting long and short sensitizable paths assume that the rising and falling of gate delays are either fixed or bounded. We propose several algorithms to compute the longest and shortest sensitizable path delays based on a data dependent delay model. A proposed algorithm which is based on a combination of modified static (topological) timing analysis and path sensitization techniques seems to offer the best performance. The results obtained have shown to be more accurate than the traditional path sensitization approach based on the bounded delay model
  • Keywords
    CMOS integrated circuits; delays; integrated circuit testing; network analysis; CMOS circuit; asynchronous pipelining; bounded delay model; data dependent delay model; data dependent delays; gate delays; high speed CMOS circuit testing; path delays; path sensitization approach; path sensitization technique; performance; sensitizable path delays; single phase latching; timing analysis; valid clocking; wave pipelining; Algorithm design and analysis; Circuit analysis; Circuit testing; Clocks; Delay estimation; Performance analysis; Pipeline processing; Propagation delay; Semiconductor device modeling; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design: VLSI in Computers and Processors, 1994. ICCD '94. Proceedings., IEEE International Conference on
  • Conference_Location
    Cambridge, MA
  • Print_ISBN
    0-8186-6565-3
  • Type

    conf

  • DOI
    10.1109/ICCD.1994.331878
  • Filename
    331878