DocumentCode
2161020
Title
SiGe heterojunctions in epitaxial vertical surrounding-gate MOSFETs
Author
Date, C.K. ; Plummer, J.D.
Author_Institution
Center for Integrated Syst., Stanford Univ., CA, USA
fYear
2000
fDate
13-15 June 2000
Firstpage
36
Lastpage
37
Abstract
Vertical MOSFETs are possible future architectures for memory cells as well as alternatives for conventional CMOS devices. The vertical channel allows growth of epitaxial structures, such as heterostructures, before the pillars are etched. We show how incorporation of SiGe heterostructures in vertical MOSFET devices can be used to delay the floating body effect or to modify hot carrier characteristics.
Keywords
Ge-Si alloys; MOSFET; hot carriers; semiconductor epitaxial layers; semiconductor heterojunctions; semiconductor materials; SiGe; SiGe heterojunction; epitaxial vertical surrounding-gate MOSFET; floating body effect; hot carrier characteristics; memory cell; pillar etching; Breakdown voltage; Etching; Germanium silicon alloys; Heterojunctions; Hot carriers; Impact ionization; MOSFETs; Medical simulation; Photonic band gap; Silicon germanium;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Technology, 2000. Digest of Technical Papers. 2000 Symposium on
Conference_Location
Honolulu, HI, USA
Print_ISBN
0-7803-6305-1
Type
conf
DOI
10.1109/VLSIT.2000.852759
Filename
852759
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