• DocumentCode
    2161020
  • Title

    SiGe heterojunctions in epitaxial vertical surrounding-gate MOSFETs

  • Author

    Date, C.K. ; Plummer, J.D.

  • Author_Institution
    Center for Integrated Syst., Stanford Univ., CA, USA
  • fYear
    2000
  • fDate
    13-15 June 2000
  • Firstpage
    36
  • Lastpage
    37
  • Abstract
    Vertical MOSFETs are possible future architectures for memory cells as well as alternatives for conventional CMOS devices. The vertical channel allows growth of epitaxial structures, such as heterostructures, before the pillars are etched. We show how incorporation of SiGe heterostructures in vertical MOSFET devices can be used to delay the floating body effect or to modify hot carrier characteristics.
  • Keywords
    Ge-Si alloys; MOSFET; hot carriers; semiconductor epitaxial layers; semiconductor heterojunctions; semiconductor materials; SiGe; SiGe heterojunction; epitaxial vertical surrounding-gate MOSFET; floating body effect; hot carrier characteristics; memory cell; pillar etching; Breakdown voltage; Etching; Germanium silicon alloys; Heterojunctions; Hot carriers; Impact ionization; MOSFETs; Medical simulation; Photonic band gap; Silicon germanium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, 2000. Digest of Technical Papers. 2000 Symposium on
  • Conference_Location
    Honolulu, HI, USA
  • Print_ISBN
    0-7803-6305-1
  • Type

    conf

  • DOI
    10.1109/VLSIT.2000.852759
  • Filename
    852759