مرکز منطقه ای اطلاع رساني علوم و فناوري - Testing Large Analog/Digital Signal Processing Chips

DocumentCode :

2161103

Title :

Testing Large Analog/Digital Signal Processing Chips

Author :

Freeman, Smith

Author_Institution :

David Sarnoff Research Center, Inc., Princeton, N.J.

fYear :

1990

fDate :

6-8 Jun 1990

Firstpage :

116

Lastpage :

117

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Consumer Electronics, 1990. ICCE 90. IEEE 1990 International Conference on

Type :

conf

DOI :

10.1109/ICCE.1990.665887

Filename :

665887

Link To Document :