DocumentCode
2161104
Title
1.3 μm InAs/GaAs quantum dot lasers on Si substrates with current injection across direct-bonded GaAs/Si heterointerfaces
Author
Tanabe, Katsuaki ; Watanabe, Katsuyuki ; Faure, Stephane ; Arakawa, Yasuhiko
Author_Institution
Inst. for Nano Quantum Inf. Electron., Univ. of Tokyo, Tokyo, Japan
fYear
2011
fDate
18-22 Sept. 2011
Firstpage
1
Lastpage
3
Abstract
An electrically pumped InAs/GaAs quantum dot laser on a Si substrate has been demonstrated. The double-hetero laser structure was grown on a GaAs substrate and layer-transferred onto a Si substrate by GaAs/Si direct wafer bonding without oxide or metal mediation. This broad-area Fabry-Perot laser operates with current injection through the GaAs/Si interface and exhibits InAs quantum dot ground state lasing at 1.31 μm at room temperature with a threshold current density of 205 A/cm2, the lowest among lasers on silicon.
Keywords
III-V semiconductors; elemental semiconductors; gallium arsenide; indium compounds; integrated optics; quantum dot lasers; silicon; substrates; wafer bonding; GaAs-Si; InAs-GaAs; broad-area Fabry-Perot laser; current injection; direct wafer bonding; direct-bonded heterointerfaces; double-hetero laser structure; quantum dot lasers; size 1.3 mum; substrates; Gallium arsenide; Pump lasers; Quantum dot lasers; Silicon; Substrates; Wafer bonding;
fLanguage
English
Publisher
ieee
Conference_Titel
Optical Communication (ECOC), 2011 37th European Conference and Exhibition on
Conference_Location
Geneva
ISSN
Pending
Print_ISBN
978-1-4577-1918-9
Type
conf
Filename
6066045
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