DocumentCode :
2161201
Title :
WRAPTure: a tool for evaluation and optimization of weights for weighted random pattern testing
Author :
Majumdar, Amitava
Author_Institution :
CrossCheck Technol. Inc., San Jose, CA, USA
fYear :
1994
fDate :
10-12 Oct 1994
Firstpage :
288
Lastpage :
290
Abstract :
Two problems in weighted random pattern testing are addressed: 1) finding the expected test length to sample all patterns in a given test set for a given weight set; and 2) finding the optimal weight set for minimizing expected test length for a given test set. Exact analytical expressions for expected test length for sampling all patterns from a test set are given. Expressions for approximating this quantity are also derived. Based on these results an algorithm is formulated to obtain the optimal weight assignment. Experiments carried out on test sets for several circuits (including ISCAS ´85 benchmarks) yield of the order of 95% to 100% reduction in expected test length over that achieved by current techniques
Keywords :
automatic testing; logic testing; optimisation; random processes; WRAPTure; expected test length; fanout free NAND circuits; optimal weight assignment; optimal weight set; weighted random pattern testing; Automatic test pattern generation; Benchmark testing; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Hamming distance; High definition video; Sampling methods; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1994. ICCD '94. Proceedings., IEEE International Conference on
Conference_Location :
Cambridge, MA
Print_ISBN :
0-8186-6565-3
Type :
conf
DOI :
10.1109/ICCD.1994.331907
Filename :
331907
Link To Document :
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