Enhanced surrogate models for statistical design exploiting space mapping technology

Author

Koziel, Slawomir ; Bandler, John W. ; Mohamed, Ahmed S. ; Madsen, Kaj

Author_Institution

McMaster Univ., Hamilton, Ont., Canada

fYear

2005

fDate

12-17 June 2005

Abstract

We present advances in microwave and RF device modeling exploiting space mapping (SM) technology. We propose new SM modeling formulations utilizing input mappings, output mappings, frequency scaling and quadratic approximations. Our aim is to enhance circuit models for statistical analysis and yield-driven design. We illustrate our results using a capacitively-loaded two-section impedance transformer, a single-resonator waveguide filter and a six-section H-plane waveguide filter.

Keywords

impedance convertors; integrated circuit modelling; microwave circuits; microwave filters; semiconductor device models; statistical analysis; waveguide filters; EM modeling; RF device modeling; capacitively-loaded two-section impedance transformer; circuit modeling; enhanced surrogate modeling; microwave device modeling; microwave filters; quadratic approximations; single-resonator waveguide filter; six-section H-plane waveguide filter; space mapping technology; statistical analysis; statistical design; yield-driven design; Circuit simulation; Electromagnetic waveguides; Impedance; Microwave devices; Microwave filters; Microwave technology; Radio frequency; Samarium; Space technology; Statistical analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 2005 IEEE MTT-S International

ISSN

01490-645X

Print_ISBN

0-7803-8845-3

Type

conf

DOI

10.1109/MWSYM.2005.1517012

Filename

1517012