Title :
A new multiport measurement-method using a two-port network analyzer
Author :
Lenk, Friedrich ; Doerner, Ralf
Author_Institution :
Ferdinand-Braun-Inst. fur Hochstfrequenztech., Berlin, Germany
Abstract :
A new method is presented how to characterize multiport devices using a two-port vector network-analyzer (VNA). Up to now, at least one of the port terminations had to be fully known to measure the S-parameters of the device. Our new measurement method overcomes this restriction. All of the device parameters and all of the port terminations are calculated from the device measurements.
Keywords :
S-parameters; microwave measurement; network analysers; two-port networks; S-parameter measurement; measurement errors; millimeter wave measurements; multiport circuits; multiport measurement; port terminations; scattering parameters measurement; two-port vector network-analyzer; Calibration; Impedance measurement; Measurement errors; Millimeter wave circuits; Millimeter wave measurements; Millimeter wave technology; Particle measurements; Performance evaluation; Redundancy; Scattering parameters;
Conference_Titel :
Microwave Symposium Digest, 2005 IEEE MTT-S International
Print_ISBN :
0-7803-8845-3
DOI :
10.1109/MWSYM.2005.1517031
