Statistical analysis of random errors from calibration standards

Author

Chen, Xiaoming

Author_Institution

Microelectron. Eng., BreconRidge Manuf. Solutions, Ottawa, Ont., Canada

fYear

2005

fDate

12-17 June 2005

Abstract

This paper presents the results of error estimation caused by the VNA calibration standards using StatistiCAL designed at NIST. A GCPW-stripline-GCPW type transition and a test fixture for transceiver module testing are chosen to do the study over 8 to 12 GHz. Calibration standards, that is through, lines and shorts are fabricated in-house. The electromagnetic modeling needed in the development of the calibration standards is done through Ansoft HFSS. The results are used to verify HFSS simulations and they are effectively applied to module testing and performance screening.

Keywords

calibration; coplanar waveguides; error analysis; measurement standards; microwave measurement; network analysers; statistical analysis; strip lines; transceivers; waveguide transitions; 8 to 12 GHz; GCPW stripline; GCPW type transition; StatistiCAL calibration standards; VNA calibration standards; electromagnetic modeling; error estimation; random errors; scattering parameters; statistical error analysis; transceiver module testing; vector network analyzers; Calibration; Ceramics; Electromagnetic modeling; Electronics packaging; Frequency; Measurement standards; Scattering parameters; Standards development; Statistical analysis; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 2005 IEEE MTT-S International

ISSN

01490-645X

Print_ISBN

0-7803-8845-3

Type

conf

DOI

10.1109/MWSYM.2005.1517032

Filename

1517032