DocumentCode
2162094
Title
Yield-Driven EM Optimization using Space Mapping-Based Neuromodels
Author
Bandler, J.W. ; Rayas-Sánchez, J.E. ; Zhang, Q.J.
Author_Institution
Bandler Corporation, P.O. Box 8083, Dundas, Canada L9H 5E7; McMaster University, 1280 Main St. West, Hamilton, Canada L8S 4K1, j.bandler@ieee.org, bandler@mcmaster.ca
fYear
2001
fDate
24-26 Sept. 2001
Firstpage
1
Lastpage
4
Abstract
In this work, an efficient procedure to realize electromagnetics-based yield optimization and statistical analysis of microwave structures using space mapping-based neuromodels is proposed. A generalized relationship between the fine and coarse model sensitivities through the Jacobian of the neuromapping is proposed. Our technique is illustrated by the EM-based statistical analysis and yield optimization of an HTS microstrip filter.
Keywords
Analytical models; Circuit simulation; Computational modeling; Frequency; High temperature superconductors; Jacobian matrices; Microstrip filters; Microwave filters; Neural networks; Statistical analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 2001. 31st European
Conference_Location
London, England
Type
conf
DOI
10.1109/EUMA.2001.338979
Filename
4140047
Link To Document