DocumentCode :
2162844
Title :
International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224)
fYear :
2001
fDate :
2-5 Dec. 2001
Abstract :
Conference proceedings front matter may contain various advertisements, welcome messages, committee or program information, and other miscellaneous conference information. This may in some cases also include the cover art, table of contents, copyright statements, title-page or half title-pages, blank pages, venue maps or other general information relating to the conference that was part of the original conference proceedings.
Keywords :
semiconductor devices; CMOS devices; compound semiconductors; detectors; displays; electron devices; integrated circuit manufacturing; interconnect reliability; process technology; quantum electronics; sensors; simulation models; solid-state devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 2001. IEDM '01. Technical Digest. International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-7050-3
Type :
conf
DOI :
10.1109/IEDM.2001.979359
Filename :
979359
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2162844
بازگشت