Title :
Transistor gating: Reduction of leakage current and power in full subtractor circuit
Author :
Gautam, M. ; Akashe, Shyam
Author_Institution :
Dept. Electron. & Comm, ITM Univ., Gwalior, India
Abstract :
In this paper low-power design techniques proposed to minimize the standby leakage power in nanoscale CMOS very large scale integration (VLSI) systems by generating transistor grating technology. In low-power design for circuit to reduce the power supply voltage and this requires the transistor threshold voltages to also be reduced to maintain throughput and noise margins., this increases the subthreshold leakage current in p and n MOSFETs. this begins to increase the overall power in digital circuits. How-ever, this increases the subthreshold leakage current of p and n MOSFETs, which starts to set the power savings obtained from power supply reduction. In transistor grating technology two sleep transistors PMOS and NMOS are inserted in between the supply voltage and ground. A PMOS is inserted in between pull-up network and network output and a NMOS is inserted in between pull-down network and ground. During standby mode both sleep transistor are turned off. By applying this technique reduction in leakage current is 17.58% and power is 24.38%. The tool used is CADENCE VIRTUOSO for schematic simulation. The simulation technology used is 45nm.
Keywords :
CMOS integrated circuits; MOSFET; VLSI; circuit simulation; integrated circuit noise; leakage currents; low-power electronics; nanoelectronics; transistor circuits; CADENCE VIRTUOSO; MOSFET; NMOS; PMOS; VLSI system; digital circuit power; full subtractor circuit; low-power design technique; nanoscale CMOS; network output; noise margin; power saving; power supply reduction; power supply voltage; pull-down network; pull-up network; schematic simulation; simulation technology; size 45 nm; sleep transistor; standby leakage power; subthreshold leakage current; throughput; transistor grating technology; transistor threshold voltage; very large scale integration system; CMOS integrated circuits; CMOS technology; Leakage currents; Switching circuits; Threshold voltage; Transistors; Very large scale integration; CMOS; Full subtractor; leakage current; low power; transistor grating;
Conference_Titel :
Advance Computing Conference (IACC), 2013 IEEE 3rd International
Conference_Location :
Ghaziabad
Print_ISBN :
978-1-4673-4527-9
DOI :
10.1109/IAdCC.2013.6514451