• DocumentCode
    2163298
  • Title

    Radar characterization of automobiles and surrogate test-targets for evaluating automotive pre-collision systems

  • Author

    Buller, William T. ; LeBlanc, David J.

  • Author_Institution
    Michigan Tech Res. Inst., Michigan Technol. Univ., Ann Arbor, MI, USA
  • fYear
    2012
  • fDate
    8-14 July 2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We measured and characterized the radar response of twenty-five vehicles to evaluate the quality of surrogate test targets. The vehicles are selected form a broad range of vehicle classes and include several that are frequently struck in rear-end collisions as determined by the U.S. National Crash Database [1]. Each vehicle´s response is measured with a wideband, millimeter wave, instrumentation radar at a set of identical angles near tail-aspect. The collected signatures for each vehicle and test-surrogates are fit to a Γ-distribution using a maximum-likelihood estimator. The wideband waveform provides spatial separation of scattering sources for additional analysis. The main result of this research is a process for characterizing automobile responses at W-band, how we use these results to identify good design practices for developing radio-frequency (RF) test surrogates and the impacts of these designs on test procedures for evaluating RF pre-collision systems (PCS).
  • Keywords
    electromagnetic wave scattering; millimetre wave radar; road vehicle radar; RF precollision systems; U.S. National Crash Database; W-band; automobile responses; automobiles radar characterization; automotive precollision systems; instrumentation radar; maximum-likelihood estimator; radar response; radio-frequency test; rear-end collisions; scattering sources; spatial separation; surrogate test-targets; vehicle classes; vehicle response; wideband millimeter wave; Radar cross section; Radio frequency; Vehicle crash testing; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium (APSURSI), 2012 IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1522-3965
  • Print_ISBN
    978-1-4673-0461-0
  • Type

    conf

  • DOI
    10.1109/APS.2012.6349386
  • Filename
    6349386