DocumentCode :
2163695
Title :
Experimental exploration of ultra-low power CMOS design space using SOIAS dynamic VT control technology
Author :
Yang, Isabel ; Lochtefeld, Anthony ; Narendra, Siva ; Chandrakasan, Anantha ; Antoniadis, Dimitri A.
Author_Institution :
MIT, Cambridge, MA, USA
fYear :
1997
fDate :
6-9 Oct 1997
Firstpage :
76
Lastpage :
77
Abstract :
Supply voltage scaling to 1V and below, with associated VT scaling, has been identified as a key approach for energy efficient high performance computing. However, VT scaling is ultimately limited by increasing subthreshold leakage current. We experimentally explore the low VDD, VT design space using a variable threshold voltage CMOS technology, Silicon-On-Insulator-with-Active-Substrate (SOIAS), which we have developed. Energy consumption modeling indicates that the dynamic VT control afforded by SOIAS can lead to significant energy savings without sacrificing performance for systems that operate in burst mode, for example when limited by user input rate. This is of particular importance in battery operated systems
Keywords :
CMOS integrated circuits; integrated circuit design; integrated circuit measurement; integrated circuit modelling; leakage currents; silicon-on-insulator; 1 V; SOIAS; SOIAS dynamic VT control technology; Si; battery operated systems; burst mode; dynamic VT control; energy consumption modeling; silicon-on-insulator-with-active-substrate; subthreshold leakage current; supply voltage scaling; ultra-low power CMOS design; user input rate; variable threshold voltage CMOS technology; Batteries; CMOS technology; Energy consumption; Energy efficiency; High performance computing; Semiconductor device modeling; Silicon on insulator technology; Space technology; Subthreshold current; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOI Conference, 1997. Proceedings., 1997 IEEE International
Conference_Location :
Fish Camp, CA
ISSN :
1078-621X
Print_ISBN :
0-7803-3938-X
Type :
conf
DOI :
10.1109/SOI.1997.634940
Filename :
634940
Link To Document :
بازگشت