DocumentCode
2164124
Title
Experiment study about coupling effect of single-chip system under different electromagnetic pulse
Author
Xin Meng ; Bihua Zhou ; Hongbing He ; Bo Yang
Author_Institution
Lab. of Electromagn. Nanjing Eng. Inst., Nanjing
fYear
2008
fDate
2-5 Nov. 2008
Firstpage
1005
Lastpage
1008
Abstract
This work mainly aims at the study of experiment about coupling effects of single-chip system under electromagnetic pulse (EMP). The results show that the coupling degree of the connected lines to the pulse field and the characters of the EMP have notable influences on the interference peak value.
Keywords
electromagnetic coupling; electromagnetic pulse; microprocessor chips; connected lines coupling degree; electromagnetic pulse; interference peak value; single-chip system coupling effect; Coaxial cables; Current measurement; EMP radiation effects; Electric variables measurement; Electrical resistance measurement; Electromagnetic coupling; Interference; Pulse measurements; TEM cells; Voltage; coupling; electromagnetic pulse; interference; single-chip system;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas, Propagation and EM Theory, 2008. ISAPE 2008. 8th International Symposium on
Conference_Location
Kunming
Print_ISBN
978-1-4244-2192-3
Electronic_ISBN
978-1-4244-2193-0
Type
conf
DOI
10.1109/ISAPE.2008.4735391
Filename
4735391
Link To Document