Title :
Experiment study about coupling effect of single-chip system under different electromagnetic pulse
Author :
Xin Meng ; Bihua Zhou ; Hongbing He ; Bo Yang
Author_Institution :
Lab. of Electromagn. Nanjing Eng. Inst., Nanjing
Abstract :
This work mainly aims at the study of experiment about coupling effects of single-chip system under electromagnetic pulse (EMP). The results show that the coupling degree of the connected lines to the pulse field and the characters of the EMP have notable influences on the interference peak value.
Keywords :
electromagnetic coupling; electromagnetic pulse; microprocessor chips; connected lines coupling degree; electromagnetic pulse; interference peak value; single-chip system coupling effect; Coaxial cables; Current measurement; EMP radiation effects; Electric variables measurement; Electrical resistance measurement; Electromagnetic coupling; Interference; Pulse measurements; TEM cells; Voltage; coupling; electromagnetic pulse; interference; single-chip system;
Conference_Titel :
Antennas, Propagation and EM Theory, 2008. ISAPE 2008. 8th International Symposium on
Conference_Location :
Kunming
Print_ISBN :
978-1-4244-2192-3
Electronic_ISBN :
978-1-4244-2193-0
DOI :
10.1109/ISAPE.2008.4735391
