DocumentCode :
2164528
Title :
Polarization-independent photodetector with ring-type grating
Author :
Takeda, Akiko ; Aihara, Takuma ; Fukuhara, Masashi ; Ishii, Y. ; Fukuda, Motohisa
Author_Institution :
Toyohashi Univ. of Technol., Toyohashi, Japan
fYear :
2013
fDate :
18-22 Aug. 2013
Firstpage :
147
Lastpage :
148
Abstract :
We propose a polarization-independent Au/Si Schottky-type photodetector with a ring-type grating that excites surface plasmon polaritons. The electromagnetic fields in ring-type and rectangular-type grating structures are calculated using the finite-difference time-domain method. For samples with the two geometries (slit width of 100 nm, slit pitch of 440 nm, and Au film thickness of 300 nm), the polarization dependence of the photocurrent is measured and compared. We confirm that the ring-type grating photodetector has a polarization-independent photocurrent, whereas the rectangular-type grating photodetector has only higher sensitivity at specific polarization angles.
Keywords :
diffraction gratings; elemental semiconductors; finite difference time-domain analysis; gold; metallic thin films; photodetectors; polaritons; silicon; surface plasmons; Au-Si; electromagnetic fields; finite-difference time-domain method; gold film thickness; polarization-independent Schottky-type photodetector; polarization-independent photocurrent; rectangular-type grating structure; ring-type grating structure; size 100 nm; size 300 nm; surface plasmon polaritons; wavelength 440 nm; Films; Gold; Gratings; Photoconductivity; Photodetectors; Plasmons; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optical MEMS and Nanophotonics (OMN), 2013 International Conference on
Conference_Location :
Kanazawa
ISSN :
2160-5033
Print_ISBN :
978-1-4799-1512-5
Type :
conf
DOI :
10.1109/OMN.2013.6659102
Filename :
6659102
Link To Document :
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