DocumentCode
2164785
Title
An infrared detector based on nonlinear oscillation
Author
Momonoi, Daisuke ; Yamazaki, Tsutomu ; Kumagai, Shinya ; Sasaki, Motoharu
Author_Institution
Toyota Technol. Inst., Toyota, Japan
fYear
2013
fDate
18-22 Aug. 2013
Firstpage
163
Lastpage
164
Abstract
An infrared detector that uses nonlinear oscillation was fabricated for achieving high sensitivity. Transducer of the infrared detection was a torsional oscillator consisting bi-materials structures. When the incident infrared is absorbed by the torsional oscillator, the oscillator is bended due to the differences in thermal expansions. The bending hardens the spring constant of torsional oscillator to shift the resonant frequency. To improve the response to light incidence, the light-absorbing material of copper black film was deposited on the light-absorber. Reflectivity of the copper black film was 0.2%. Irradiating light onto the detector shifted the resonant frequency.
Keywords
copper; infrared detectors; metallic thin films; nonlinear optics; optical fabrication; oscillations; reflectivity; thermal expansion; transducers; Cu; bending; bimaterial structure; copper black film; infrared detector; light irradiation; light-absorbing material; nonlinear oscillation; optical fabrication; reflectivity; resonant frequency; spring constant; thermal expansion; torsional oscillator; transducer; Copper; Detectors; Films; Oscillators; Resonant frequency; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Optical MEMS and Nanophotonics (OMN), 2013 International Conference on
Conference_Location
Kanazawa
ISSN
2160-5033
Print_ISBN
978-1-4799-1512-5
Type
conf
DOI
10.1109/OMN.2013.6659110
Filename
6659110
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