Transient analysis of PCB EMC problem

Author

Cui, Jian ; Zhang, Min

Author_Institution

Modern Integrated Electromagn. Simulation R&D Center (MIEMS), Tongji Univ., Shanghai, China

fYear

2008

fDate

2-5 Nov. 2008

Firstpage

1111

Lastpage

1114

Abstract

In this paper, the partial element equivalent circuit (PEEC) and the finite integration technique (FIT) are employed individually to investigate the electromagnetic compatibility (EMC) problem of a printed circuit board (PCB). The metal-oxide-semiconductor field-effect transistor (MOSFET) on the PCB makes current noise which is caught and measured. A normalization method in FIT is introduced to study PCB radiation. As a cross check, the electric field results obtained by PEEC and FIT are compared. It is shown that they agree well with each other. Finally a system-level simulation with PCB and metallic enclosure is investigated in FIT as well.

Keywords

MOSFET; electromagnetic compatibility; equivalent circuits; integration; printed circuits; transient analysis; PCB EMC problem; electromagnetic compatibility; finite integration technique; metal-oxide-semiconductor field-effect transistor; partial element equivalent circuit; printed circuit board; transient analysis; Circuit noise; Current measurement; Electromagnetic compatibility; Electromagnetic measurements; Equivalent circuits; FETs; MOSFET circuits; Noise measurement; Printed circuits; Transient analysis; EMC; FIT; PCB; PEEC; simulation;

fLanguage

English

Publisher

ieee

Conference_Titel

Antennas, Propagation and EM Theory, 2008. ISAPE 2008. 8th International Symposium on

Conference_Location

Kunming

Print_ISBN

978-1-4244-2192-3

Electronic_ISBN

978-1-4244-2193-0

Type

conf

DOI

10.1109/ISAPE.2008.4735419

Filename

4735419