DocumentCode
2165213
Title
Algorithm research on automatic layout of automatic test system
Author
He, Bai ; Hui, Lu
Author_Institution
College of Electronic & Information Engineering, BeiHang University, Beijing, China
fYear
2010
fDate
4-6 Dec. 2010
Firstpage
4917
Lastpage
4920
Abstract
This paper proposes a new automatic layout algorithm of circuit diagram applied to automatic test system. With combining the characteristics of diagram, the algorithm implements model optimization and grading optimization of those equipments by using functions and connection information. In this paper, we use Subordination Location Algorithm based on least cross line to determine the Subordination of equipment groups and calculate the drawing geometric position of those equipment models by using Geometric Relationship Location Algorithm based on correlation information. The diagrams which are drawn out have clear hierarchy and reasonable structure.
Keywords
Arrays; Computers; Correlation; Educational institutions; Layout; Optimization; Routing; Automatic Layout; Automatic Test System; Correlation Information; Cross Line;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Science and Engineering (ICISE), 2010 2nd International Conference on
Conference_Location
Hangzhou, China
Print_ISBN
978-1-4244-7616-9
Type
conf
DOI
10.1109/ICISE.2010.5691910
Filename
5691910
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