• DocumentCode
    2165213
  • Title

    Algorithm research on automatic layout of automatic test system

  • Author

    He, Bai ; Hui, Lu

  • Author_Institution
    College of Electronic & Information Engineering, BeiHang University, Beijing, China
  • fYear
    2010
  • fDate
    4-6 Dec. 2010
  • Firstpage
    4917
  • Lastpage
    4920
  • Abstract
    This paper proposes a new automatic layout algorithm of circuit diagram applied to automatic test system. With combining the characteristics of diagram, the algorithm implements model optimization and grading optimization of those equipments by using functions and connection information. In this paper, we use Subordination Location Algorithm based on least cross line to determine the Subordination of equipment groups and calculate the drawing geometric position of those equipment models by using Geometric Relationship Location Algorithm based on correlation information. The diagrams which are drawn out have clear hierarchy and reasonable structure.
  • Keywords
    Arrays; Computers; Correlation; Educational institutions; Layout; Optimization; Routing; Automatic Layout; Automatic Test System; Correlation Information; Cross Line;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Science and Engineering (ICISE), 2010 2nd International Conference on
  • Conference_Location
    Hangzhou, China
  • Print_ISBN
    978-1-4244-7616-9
  • Type

    conf

  • DOI
    10.1109/ICISE.2010.5691910
  • Filename
    5691910