• DocumentCode
    2165960
  • Title

    Research on CCD De-Noising Technology

  • Author

    Wen, Fang ; Li, Tian-Ze

  • Author_Institution
    Sch. of Electr. & Electron Eng., Shandong Univ. of Technol., Zibo, China
  • fYear
    2009
  • fDate
    17-19 Oct. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    After the charge coupled device (CCD) noise sources is expatiated, the methods of restraining the main CCD noise are analyzed. For the shot noise, the wavelet theory and adaptive theory are combined and the error formula is derived in a sufficient sampling frequency. The working principle of CDS technology and its impact on filtering the CCD reset noise are discussed. The results show that as long as the choice of appropriate sampling time, the reset noise can be restrained furthest.
  • Keywords
    charge-coupled devices; signal denoising; wavelet transforms; CCD de-noising technology; adaptive theory; adaptive wavelet denoising; charge coupled device noise sources; reset noise; wavelet theory; Charge coupled devices; Dark current; Electrons; Filtering; Frequency; Low-frequency noise; Noise generators; Noise reduction; Signal processing; Signal to noise ratio;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image and Signal Processing, 2009. CISP '09. 2nd International Congress on
  • Conference_Location
    Tianjin
  • Print_ISBN
    978-1-4244-4129-7
  • Electronic_ISBN
    978-1-4244-4131-0
  • Type

    conf

  • DOI
    10.1109/CISP.2009.5304489
  • Filename
    5304489