DocumentCode :
2166143
Title :
New Linear SEC-DED Codes with Reduced Triple Bit Error Miscorrection Probability
Author :
Richter, Michael ; Oberlaender, K. ; Goessel, Michael
Author_Institution :
Potsdam Univ., Potsdam
fYear :
2008
fDate :
7-9 July 2008
Firstpage :
37
Lastpage :
42
Abstract :
This paper solves the problem of minimizing triple bit error miscorrection for single-error-correcting, double-error-detecting codes (SEC-DED codes) which are used to protect all kinds of memory against errors. A lower bound for triple bit error miscorrection for the widely used class of odd-weight column codes is derived and actual codes which are very close to that theoretical bound are presented. Surprisingly, significantly better results are obtained with shortened generalized Hamming codes. An optimal (39,32)-SEC-DED code with 32 information bits and 7 control bits is determined which has the lowest risk of triple bit miscorrection of any possible linear (39,32)-code. It is shown how codes with 64 and 128 information bits with significantly lower triple bit miscorrection probability than currently used codes can be derived from that code.The new codes also feature adjacent double bit error correction capabilities (SEC-DED-DAEC codes). Employing them in a SEC-DED-DAEC checker reduces the risk of miscorrecting non-adjacent double bit errors by 27-34% compared to the best codes known.
Keywords :
Hamming codes; error correction codes; error detection codes; linear codes; Hamming codes; double bit error correction capabilities; double-error-detecting codes; linear SEC-DED codes; non-adjacent double bit errors; odd-weight column codes; single-error-correcting codes; triple bit error miscorrection probability; Computer errors; Decoding; Delay; Error correction codes; Event detection; Hardware; Optimal control; Protection; Single event upset; Testing; Hsiao code; SEC-DED codes; SEC-DED-DAEC codes; triple bit error miscorrection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium, 2008. IOLTS '08. 14th IEEE International
Conference_Location :
Rhodes
Print_ISBN :
978-0-7695-3264-6
Type :
conf
DOI :
10.1109/IOLTS.2008.27
Filename :
4567057
Link To Document :
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