Title :
Growing Interest of Advanced Commercial CMOS Technologies for Space and Medical Applications. Illustration with a New Nano-Power and Radiation-Hardened SRAM in 130nm CMOS
Author :
Roche, Philippe ; Lysinger, Mark ; Gasiot, Gilles ; Daveau, Jean-Marc ; Zamanian, Mehdi ; Dautriche, Pierre
Author_Institution :
STMicroelectronics, Crolles
Abstract :
This paper reviews recent experimental confirmations that the intrinsic radiation robustness of commercial CMOS technologies naturally improves with the down-scaling. When additionally using innovative design techniques, it becomes now possible to assure that performance and radiation-hardness are both met. An illustration is given with an original nano-power and radiation-hardened 8 Mb SRAM designed in 130 nm CMOS.
Keywords :
CMOS memory circuits; SRAM chips; biomedical electronics; radiation hardening (electronics); space vehicle electronics; CMOS technology; advanced commercial CMOS technologies; intrinsic radiation robustness; medical applications; radiation-hardened SRAM; radiation-hardness; size 130 nm; space applications; storage capacity 8 Mbit; Biomedical equipment; CMOS technology; Medical services; Random access memory; Space technology;
Conference_Titel :
On-Line Testing Symposium, 2008. IOLTS '08. 14th IEEE International
Conference_Location :
Rhodes
Print_ISBN :
978-0-7695-3264-6
DOI :
10.1109/IOLTS.2008.60
