• DocumentCode
    2166459
  • Title

    The evolution of DRAM technology towards WSI

  • Author

    Warren, Ken ; Sinclair, Alan

  • fYear
    1991
  • fDate
    29-31 Jan 1991
  • Firstpage
    243
  • Lastpage
    247
  • Abstract
    Issues connected with the evolution of dynamic random-access memory (DRAM) technology towards wafer scale integration (WSI) are examined. It is pointed out that as one moves towards submicron technologies, fundamental physical, electrical, and processing limits are being encountered, and it is becoming clear that this trend cannot continue. This phenomenon is most clearly demonstrated by the development of DRAM technology. The costs to develop new fabrication lines are escalating to levels that require funding investments approaching national rather that corporate budgets. It is concluded that it is these factors which make WSI and related high-density interconnect technologies an inevitability if demands for higher levels of circuit integration are to continue to be satisfied into the nineties and beyond
  • Keywords
    DRAM chips; VLSI; integrated circuit technology; technological forecasting; DRAM technology; WSI; costs; dynamic random-access memory; electrical limits; fundamental physical limits; funding investments; high-density interconnect technologies; processing limits; submicron technologies; wafer scale integration; Costs; Fabrication; Geometry; Integrated circuit interconnections; Investments; Lead compounds; Random access memory; Semiconductor devices; Silicon; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wafer Scale Integration, 1991. Proceedings., [3rd] International Conference on
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-8186-9126-3
  • Type

    conf

  • DOI
    10.1109/ICWSI.1991.151721
  • Filename
    151721