• DocumentCode
    2166546
  • Title

    Lead-free flip chip process development

  • Author

    Gafffney, K. ; Poarch, Justin ; Delaney, Drew

  • Author_Institution
    Semicond. Products Sector, Motorola Inc., Tempe, AZ, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    129
  • Lastpage
    133
  • Abstract
    With environmental concerns increasing, the electronics industry is focusing more attention on lead free solder alternatives. One challenge is to find an alternative solder that is as manufacturable, reliable and cost effective as the industry standard eutectic tin-lead or high lead solders. This study details the process development for a flip chip assembly using one of these alternative lead-free solders. Specifically, three flip chip fluxes and five underfills were used to assemble flip chip parts while keeping the no-lead solder, die passivation and substrate solder mask constant. Solder wetting characteristics were observed optically after cross sectioning the assemblies. The compatibility of different flux and underfill types, defined as no underfill voiding after assembly, was determined via acoustic microscopy. Assembled parts were subjected to JEDEC Level 3 moisture preconditioning. Post JEDEC preconditioning electrical and adhesion data helped identify one or more compatible flip chip material sets to be used for further lead free solder development work
  • Keywords
    environmental factors; flip-chip devices; soldering; acoustic microscopy; adhesion; electronic packaging; environmental factors; flip-chip assembly; lead-free solder; moisture preconditioning; underfill material; wetting; Assembly; Costs; Electronics industry; Environmentally friendly manufacturing techniques; Flip chip; Lead; Manufacturing industries; Microscopy; Moisture; Passivation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-7803-5908-9
  • Type

    conf

  • DOI
    10.1109/ECTC.2000.853133
  • Filename
    853133