• DocumentCode
    2166965
  • Title

    On Line Testing of Single Feedback Bridging Fault in Cluster Based FPGA by Using Asynchronous Element

  • Author

    Das, Nachiketa ; Roy, Pranab ; Rahaman, Hafizur

  • Author_Institution
    Sch. of VLSI Technol., Bengal Eng. & Sci. Univ., Shibpur
  • fYear
    2008
  • fDate
    7-9 July 2008
  • Firstpage
    190
  • Lastpage
    191
  • Abstract
    In this paper, we present a novel technique for online testing of feedback bridging faults in the interconnects of the cluster based FPGA. The detection circuit will be implemented using BISTER configuration. We have configured the Block Under Test (BUT) with a pseudo-delay independent asynchronous element. Since we have exploited the concept of asynchronous element known as Muller-C element in order to detect the fault, the fault has high ingredient of delay dependent properties due to variation of the feedback path delay. Xilinx Jbits 3.0 API (Application Program Interface) is used to implement the BISTER structure in the FPGA. By using Jbits, we can reconfigure dynamically the device, in which the partial bit stream only affects part of the device. In the comparison to the traditional FPGA development tool (ISE), Jbits is faster to map the specific portion of the circuit to a specific tile. We also have more controllability over the utilization of internal resources of FPGA, so that we can perform this partial reconfiguration.
  • Keywords
    automatic test software; delays; field programmable gate arrays; integrated circuit interconnections; integrated circuit testing; logic testing; BISTER configuration; FPGA interconnect; Muller-C element; Xilinx Jbits 3.0 API; cluster based FPGA; feedback path delay; on-line testing; partial reconfiguration; pseudo-delay independent asynchronous element; single feedback bridging fault; Circuit faults; Circuit testing; Controllability; Delay; Electrical fault detection; Fault detection; Feedback; Field programmable gate arrays; Integrated circuit interconnections; Tiles; Application Program Interface; BISTER; FPGA; J-bit; Muller-C; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium, 2008. IOLTS '08. 14th IEEE International
  • Conference_Location
    Rhodes
  • Print_ISBN
    978-0-7695-3264-6
  • Type

    conf

  • DOI
    10.1109/IOLTS.2008.11
  • Filename
    4567091