DocumentCode
2166965
Title
On Line Testing of Single Feedback Bridging Fault in Cluster Based FPGA by Using Asynchronous Element
Author
Das, Nachiketa ; Roy, Pranab ; Rahaman, Hafizur
Author_Institution
Sch. of VLSI Technol., Bengal Eng. & Sci. Univ., Shibpur
fYear
2008
fDate
7-9 July 2008
Firstpage
190
Lastpage
191
Abstract
In this paper, we present a novel technique for online testing of feedback bridging faults in the interconnects of the cluster based FPGA. The detection circuit will be implemented using BISTER configuration. We have configured the Block Under Test (BUT) with a pseudo-delay independent asynchronous element. Since we have exploited the concept of asynchronous element known as Muller-C element in order to detect the fault, the fault has high ingredient of delay dependent properties due to variation of the feedback path delay. Xilinx Jbits 3.0 API (Application Program Interface) is used to implement the BISTER structure in the FPGA. By using Jbits, we can reconfigure dynamically the device, in which the partial bit stream only affects part of the device. In the comparison to the traditional FPGA development tool (ISE), Jbits is faster to map the specific portion of the circuit to a specific tile. We also have more controllability over the utilization of internal resources of FPGA, so that we can perform this partial reconfiguration.
Keywords
automatic test software; delays; field programmable gate arrays; integrated circuit interconnections; integrated circuit testing; logic testing; BISTER configuration; FPGA interconnect; Muller-C element; Xilinx Jbits 3.0 API; cluster based FPGA; feedback path delay; on-line testing; partial reconfiguration; pseudo-delay independent asynchronous element; single feedback bridging fault; Circuit faults; Circuit testing; Controllability; Delay; Electrical fault detection; Fault detection; Feedback; Field programmable gate arrays; Integrated circuit interconnections; Tiles; Application Program Interface; BISTER; FPGA; J-bit; Muller-C; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium, 2008. IOLTS '08. 14th IEEE International
Conference_Location
Rhodes
Print_ISBN
978-0-7695-3264-6
Type
conf
DOI
10.1109/IOLTS.2008.11
Filename
4567091
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