An integrated functional tester for CMOS logic

Author

Low, William ; Ivanov, André

Author_Institution

Dept. of Electr. Eng., British Columbia Univ., Vancouver, BC, Canada

fYear

1993

fDate

14-17 Sep 1993

Firstpage

453

Abstract

This paper presents the architecture of a functional tester system based on a functional tester chip (FTC) featuring per-pin programmability, output waveform formatting (NR, RC, RH, and RL), input window comparison and on-the-fly format switching. Waveforms are encoded using a set of simple 8-bit instructions. The bandwidth requirements of each channel is 8 bits per test vector. A four-channel FTC implemented using digital standard cells, with a 1.2 micron dual metal layer CMOS process, has a die size of 7×6 mm² (core: 6×5 mm ²). Each channel occupies approximately 17% of the core area. Almost half the channel area is used by the format memory which provides a cache of the required timing and formats for a given test. Preliminary results based on measurements from an early version of the wave formatting circuit suggest that edge resolutions of at least 1.5 ns are possible

Keywords

CMOS integrated circuits; encoding; functional analysis; integrated circuit testing; logic testing; 1.2 mum; 5 mm; 6 mm; 7 mm; 8-bit instructions; CMOS logic; bandwidth requirements; die size; digital standard cells; dual metal layer CMOS process; edge resolutions; encoded; format memory; functional tester chip; functional tester system; input window comparison; integrated circuit testing; integrated functional tester; on-the-fly format switching; output waveform formatting; programmability; required timing; test vector; wave formatting circuit; Bit rate; CMOS logic circuits; CMOS process; Circuit testing; Integrated circuit measurements; Integrated circuit testing; Logic testing; Prototypes; System testing; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical and Computer Engineering, 1993. Canadian Conference on

Conference_Location

Vancouver, BC

Print_ISBN

0-7803-2416-1

Type

conf

DOI

10.1109/CCECE.1993.332196

Filename

332196