Title :
Comprehensive study of substrate noise isolation for mixed-signal circuits
Author :
To, K.H. ; Welch, P. ; Bharatan, S. ; Lehning, H. ; Huynh, T.L. ; Thoma, R. ; Monk, D. ; Huang, W.A. ; Ilderem, V.
Author_Institution :
Digital DNA Labs., Motorola Inc., Mesa, AZ, USA
Abstract :
In this paper, we present a study on signal isolation approaches for mixed-signal circuits, via both simple test structures and actual circuits. Analysis was focused on commonly used substrates such as p+, p- and buried p+ substrate. Results show that the selection of substrate, isolation structures and layout rules have significant impact on the substrate noise isolation.
Keywords :
integrated circuit noise; isolation technology; mixed analogue-digital integrated circuits; substrates; mixed-signal circuit; substrate noise isolation; BiCMOS integrated circuits; Circuit noise; Circuit testing; Digital circuits; Isolation technology; Noise generators; Radio frequency; Ring oscillators; Silicon compounds; Switching circuits;
Conference_Titel :
Electron Devices Meeting, 2001. IEDM '01. Technical Digest. International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-7050-3
DOI :
10.1109/IEDM.2001.979559
