DocumentCode
2167066
Title
Comprehensive study of substrate noise isolation for mixed-signal circuits
Author
To, K.H. ; Welch, P. ; Bharatan, S. ; Lehning, H. ; Huynh, T.L. ; Thoma, R. ; Monk, D. ; Huang, W.A. ; Ilderem, V.
Author_Institution
Digital DNA Labs., Motorola Inc., Mesa, AZ, USA
fYear
2001
fDate
2-5 Dec. 2001
Abstract
In this paper, we present a study on signal isolation approaches for mixed-signal circuits, via both simple test structures and actual circuits. Analysis was focused on commonly used substrates such as p+, p- and buried p+ substrate. Results show that the selection of substrate, isolation structures and layout rules have significant impact on the substrate noise isolation.
Keywords
integrated circuit noise; isolation technology; mixed analogue-digital integrated circuits; substrates; mixed-signal circuit; substrate noise isolation; BiCMOS integrated circuits; Circuit noise; Circuit testing; Digital circuits; Isolation technology; Noise generators; Radio frequency; Ring oscillators; Silicon compounds; Switching circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 2001. IEDM '01. Technical Digest. International
Conference_Location
Washington, DC, USA
Print_ISBN
0-7803-7050-3
Type
conf
DOI
10.1109/IEDM.2001.979559
Filename
979559
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