Title :
Force microscopy using backscattered light
Author :
Volpe, Giovanni ; Kozyreff, Gregory ; Petrov, Dmitri
Author_Institution :
lCFO-Inst. de Ciencies Fotoniques, Castelldefels
Abstract :
An optically trapped particle works as an extremely sensitive probe for the measurement of pico-and femto-Newton forces in microscopic systems (photonic force microscopy, PFM). It comprises an optical trap to hold the probe particle and a position sensing system. The backscattered light field projected on a quadrant photon detector (QPD) or a position sensitive detector (PSD) to monitor the position of the particle.
Keywords :
backscatter; force measurement; light scattering; optical microscopy; quantum optics; radiation pressure; PSD; QPD; backscattered light; backscattered light field projection; femto-Newton forces; force microscopy; microscopic systems; optical trapping; photonic force microscopy; pico-Newton forces; position sensitive detector; quadrant photon detector; Charge carrier processes; Force measurement; Monitoring; Optical microscopy; Optical sensors; Particle measurements; Position sensitive particle detectors; Probes; Ultrafast optics; Ultraviolet sources;
Conference_Titel :
Lasers and Electro-Optics, 2007 and the International Quantum Electronics Conference. CLEOE-IQEC 2007. European Conference on
Conference_Location :
Munich
Print_ISBN :
978-1-4244-0931-0
Electronic_ISBN :
978-1-4244-0931-0
DOI :
10.1109/CLEOE-IQEC.2007.4386656
