Sub-Micron CMOS Characterisation for Single Chip Wireless Applications

Author

Toner, B. ; Fusco, V.F. ; Alam, M.S. ; Armstrong, G.A.

Author_Institution

The Department of Electrical and Electronic Engineering, The Queens University of Belfast, Ashby Building, Stranmillis Road, Belfast, N. Ireland, BT9 5AH. Tel: (028) 90274089, Fax: (028) 90667023, E-mail: b.toner@ee.qub.ac.uk

fYear

2001

fDate

24-26 Sept. 2001

Firstpage

1

Lastpage

4

Abstract

This paper describes a multifunctional, electronically reconfigurable, small/large signal load pull measurement system and its integrated use with BSIM 3v3 for modelling of sub-micron CMOS transistors and sub-circuits. This turnkey measurement system can be electronically configured from a battery of instruments in order to characterise minimum noise, optimum power, intermodulation, dc and S-parameters, together with harmonic response and dynamic load line information under both source and load pull conditions. The instrumentation provides validation data against the BSIM physical model simulator. Hence, for the first time measurement of all of the significant devices parameters can be made for the device operated under all possible primary modes for model validation so that optimal circuit design can be carried out in a holistic fashion.

Keywords

Battery charge measurement; Circuit simulation; Instruments; Noise measurement; Power measurement; Power system harmonics; Power system modeling; Scattering parameters; Semiconductor device measurement; Semiconductor device modeling;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference, 2001. 31st European

Conference_Location

London, England

Type

conf

DOI

10.1109/EUMA.2001.339184

Filename

4140252