Title :
Analytical models for coupled distributed RLC lines with ideal and nonideal return paths
Author :
Naeemi, A. ; Davis, J.A. ; Meindl, J.D.
Author_Institution :
Microelectron. Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
New analytical models that describe distributed RLC interconnects with ideal and nonideal return paths are used to optimize the time delay and crosstalk of a state-of-the-art high-speed global interconnect structure that incorporates coplanar ground lines such that the delay and crosstalk are reduced by 12% and 38%, respectively.
Keywords :
crosstalk; delays; distributed parameter networks; integrated circuit interconnections; integrated circuit modelling; RLC interconnects; analytical models; coplanar ground lines; coupled distributed RLC lines; crosstalk; high-speed global interconnect structure; ideal return paths; nonideal return paths; time delay; Analytical models; Capacitance; Crosstalk; Delay effects; Frequency; Inductance; Microelectronics; Optical propagation; Periodic structures; Switches;
Conference_Titel :
Electron Devices Meeting, 2001. IEDM '01. Technical Digest. International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-7050-3
DOI :
10.1109/IEDM.2001.979604
