Title :
2008 IEEE International conference on Integrated Circuit Design and Technology
Abstract :
The following topics are dealt: advanced transistor structure, architecture and process; RF & AMS; low power electronics; reliability; system level technology assessment; DFM/DFT/DFY/DFR; advanced memory devices; advanced materials; soft error rate; SoC/MPSoC/SIP, IC & platform design & process; and CAD.
Keywords :
analogue integrated circuits; circuit CAD; design for manufacture; design for testability; integrated circuit design; integrated circuit reliability; integrated circuit yield; integrated memory circuits; logic design; low-power electronics; mixed analogue-digital integrated circuits; multiprocessing systems; radiation hardening (electronics); radiofrequency integrated circuits; semiconductor technology; system-in-package; system-on-chip; transistors; CAD; DFM; DFR; DFT; DFY; IC design; IC process; MPSoC; RF integrated circuits; SIP; SoC; advanced memory devices; analog/mixed-signal circuit; low power electronics; reliability aspects; soft error rate; system level technology assessment; transistor architecture; transistor structure;
Conference_Titel :
Integrated Circuit Design and Technology and Tutorial, 2008. ICICDT 2008. IEEE International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-1810-7
DOI :
10.1109/ICICDT.2008.4567222
