DocumentCode
2168302
Title
High-frequency electrical performance of a new high-density multiple line grid array (MLGA) package
Author
Ahn, Seungyoung ; Lee, Joon-Woo ; Kim, Jonghoon ; Ryu, Woongwhan ; Kim, Young-Soo ; Yoon, Chong K. ; Kim, Joungbo
Author_Institution
Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea
fYear
2000
fDate
2000
Firstpage
497
Lastpage
501
Abstract
In this paper, we firstly introduce a new type of high-density package, called as Multiple Line Grid Array (MLGA) package. The MLGA package is developed as a strong candidate for next-generation, cost-effective, and high-density package manufactured by GLOTECH Inc. Moreover, the MLGA package not only provides excellent electrical transfer characteristics for high-frequency applications over 10 GHz, but also has improved thermal conductance of heat dissipation. We used the model parameter extraction procedure using network analyzer HP8510 and cascade probe, and the cascade transmission matrix conversion was performed to extract the equivalent circuit model parameters of the MLGA package. Two types of the MLGA packages were fabricated using ceramic and polymer. As a result of the model parameter extraction, the parasitic inductance and the parasitic capacitance were shown to be less than 0.34 nH and 0.33 pF, respectively for the MLGA package of 500 μm height, demonstrating the applications in the frequency range of over 10 GHz
Keywords
cooling; equivalent circuits; integrated circuit packaging; network analysers; thermal management (packaging); 10 GHz; 500 micron; GLOTECH; MLGA; cascade transmission matrix conversion; electrical transfer characteristics; equivalent circuit model parameters; heat dissipation; high-density multiple line grid array package; high-frequency electrical performance; model parameter extraction procedure; network analyzer; parasitic capacitance; parasitic inductance; thermal conductance; Ceramics; Equivalent circuits; Heat transfer; Manufacturing; Packaging; Parameter extraction; Performance analysis; Probes; Resistance heating; Thermal conductivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
Conference_Location
Las Vegas, NV
Print_ISBN
0-7803-5908-9
Type
conf
DOI
10.1109/ECTC.2000.853203
Filename
853203
Link To Document