DocumentCode
2168380
Title
Jitter Characterization of Pseudo-random Bit Sequences Using Incoherent Sub-sampling
Author
Choi, Hyun ; Chatterjee, Abhijit
Author_Institution
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear
2010
fDate
1-4 Dec. 2010
Firstpage
9
Lastpage
14
Abstract
In this paper, jitter analysis algorithms for characterizing timing jitter of multi-Gbps pseudo-random bit sequences (PRBSs) are presented. For signal acquisition, incoherent sub-sampling is employed to increase the effective sampling rate of a digitizer and to simplify its signal acquisition architecture by removing the need for timing synchronization circuits. As a substitute for these circuits, algorithms for signal clock recovery (CR) and waveform reconstruction from the acquired data are developed in this research. The algorithms utilize peak identification of the sampled signal spectrum and the sparsity of the reconstructed waveform in the frequency domain as decision making criteria for accurate signal reconstruction. The jitter value of such a reconstructed waveform is quantified with the use of a wavelet based denoising method to generate a self-reference signal against which zero-crossing times are compared to generate jitter statistics. In addition, the data dependent jitter components can be differentiated from the original jitter by analyzing zero-crossing discrepancies of the self-reference signal.
Keywords
decision making; frequency-domain analysis; random number generation; signal denoising; signal detection; signal reconstruction; synchronisation; timing circuits; timing jitter; decision making; frequency domain; incoherent sub-sampling; jitter analysis; multiGbps pseudorandom bit sequences; signal acquisition; signal clock recovery; signal reconstruction; timing jitter; timing synchronization circuits; waveform reconstruction; wavelet denoising; zero crossing times; Estimation; Frequency estimation; Hardware; Jitter; Signal processing algorithms; Time frequency analysis; Jitter characterization; incoherent sub-sampling;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ATS), 2010 19th IEEE Asian
Conference_Location
Shanghai
ISSN
1081-7735
Print_ISBN
978-1-4244-8841-4
Type
conf
DOI
10.1109/ATS.2010.11
Filename
5692212
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