DocumentCode :
2168381
Title :
Study of error propagation due to dust for thin-cover coat disk systems
Author :
Watanabe, Tetsu ; Saito, Kimihiro ; Seo, Katsuhiro
Author_Institution :
Opt. Disc Dev. Div., Sony Corp., Tokyo, Japan
fYear :
2002
fDate :
2002
Firstpage :
126
Lastpage :
128
Abstract :
In recent years, optical disc systems with shorter wavelength laser diodes and higher numerical aperture (NA) objective lenses have been studied in order to realize higher storage density recording. However, high NA optical systems have the problem of an increase in coma aberration caused by disk tilt. It is necessary to use a thinner disk cover coating to achieve the same coma aberration margin as standard optical disc systems. Table-1 shows the optical parameters and the cover coat thickness of the optical disk systems up to date. However, the thinner cover coat disk systems entail the problem that dust and scratches on the disk surface cause data errors. In this study, we discuss the relationships between data error propagation and cover coat thickness, and between the error propagation and size of dust on the disk surface. We also discuss the abilities of error correcting codes (ECCs) against dust on the disks.
Keywords :
aberrations; dust; error analysis; error correction codes; microlenses; optical disc storage; particle size; protective coatings; semiconductor lasers; surface contamination; ECC; NA; coma aberration; data error propagation; disk cover coat thickness; disk surface scratches; disk tilt; dust generated errors; dust particle size; error correcting codes; objective lens numerical aperture; optical disc system parameters; optical disk storage; recording storage density; short wavelength laser diodes; thin-cover coat disk systems; Drives; Error correction; Error correction codes; Glass; Optical films; Optical propagation; Optical recording; Optical surface waves; Thickness measurement; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optical Memory and Optical Data Storage Topical Meeting, 2002. International Symposium on
Print_ISBN :
0-7803-7379-0
Type :
conf
DOI :
10.1109/OMODS.2002.1028589
Filename :
1028589
Link To Document :
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