A Quasi-best Random Testing

Random testing, having been employed in both hardware and software for a long time, is well known for its simplicity and straightforwardness, in which each test is selected randomly regardless of the tests previously generated. However, traditionally, it seems to be inefficient for its random selection of test patterns. Therefore, a new concept of quasi-best distance random testing is proposed in the paper to make it more effective in testing. The new idea is based on the fact that the distance between two adjacent selected test vectors in a test sequence would greatly influence the efficiency of fault testing. Procedures of constructing such a testing sequence are presented and discussed in detail. The new approach has shown its remarkable advantage of fitting in most circuits. Experimental results and mathematical analysis of efficiency are also given to assess the performances of the proposed approach.