DocumentCode :
2168581
Title :
Study on metal adhesion mechanisms in high density interconnect printed circuit boards
Author :
Martin, Lara J. ; Wong, C.P.
Author_Institution :
Motorola Inc., Plantation, FL., USA
fYear :
2000
fDate :
2000
Firstpage :
549
Lastpage :
557
Abstract :
Strong chemical reactions between metal and polymer substrates significantly enhance adhesion of the metal to the polymer. This study investigated the adhesion of three types of thin film metals, including Cu, NiCr, and Cr, to a fully epoxy-based polymer. Before depositing these thin film metals, the epoxy surface was treated with either an Ar or O plasma etch. It was found that NiCr and Cr produced higher peel strengths than Cu, but NiCr and Cr did not produce different peel strengths than each other. It was also found that O plasma etch produced higher peel strengths than Ar plasma etch. An XPS (X-ray photoelectron spectroscopy) study was performed to determine the reactivities of the metal thin films with the epoxy. Both the Ni and Cr of the NiCr thin film reacted with the epoxy, forming metal oxide at the metal-epoxy interface. It was determined that Cr thin film reacted more strongly, forming slighty more metal oxide at the metal-epoxy interface. Cu was not seen to react strongly with the epoxy. Thermodynamic information supported the relative amounts of oxides found by XPS. When comparing the Ar-treated to the O-treated samples for the NiCr and Cr metal types, more oxide was seen on the O-treated samples
Keywords :
adhesion; chemical reactions; chromium; chromium alloys; copper; interconnections; metallic thin films; nickel alloys; printed circuits; sputtered coatings; surface chemistry; surface treatment; Ar; Ar or O plasma etch; Ar plasma; Cr; Cr thin film; Cu; NiCr; NiCr thin film; O; O plasma etch; X-ray photoelectron spectroscopy; XPS; chemical reactions; epoxy surface; epoxy-based polymer; high density interconnect printed circuit boards; metal adhesion; metal to the polymer; metal-epoxy interface; peel strengths; thermodynamic state; thin film metals; Adhesives; Argon; Chemicals; Chromium; Etching; Plasma applications; Plasma x-ray sources; Polymer films; Substrates; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-5908-9
Type :
conf
DOI :
10.1109/ECTC.2000.853212
Filename :
853212
Link To Document :
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