DocumentCode :
2168688
Title :
The mechanics and impact of hygroscopic swelling of polymeric materials in electronic packaging
Author :
Wong, E.H. ; Chan, K.C. ; Rajoo, R. ; Lim, T.B.
Author_Institution :
Inst. of Microelectron., Singapore
fYear :
2000
fDate :
2000
Firstpage :
576
Lastpage :
580
Abstract :
A reliable technique for characterising the hygroscopic swelling of materials has been developed and used to characterise a number of packaging materials. The hygro-swelling of these materials, though varing in magnitude, exhibits a common behavior in that it increases with temperature and decreases sharply across Tg. Using this data, hygroscopic stress modeling was performed on leaded and substrate based packages. The hygroscopic stress induced through moisture conditioning was found to be significant compared to the thermal stress during solder reflow. Hygroscopic stress in over-molded wire bond PBGA & molded flip chip PBGA was found to be 1.3 to 1.5 times that of thermal stress. Hygroscopic swelling of the underfill in flip chip PBGA was found to be the main failure driver during autoclave test. Autoclave performance of flip chip PBGA package assembled with different underfills & chips was analysed. Excellent correlation was found between autoclave performance and the hygroscopic swelling characteristics of the underfills
Keywords :
ball grid arrays; environmental degradation; failure analysis; finite element analysis; flip-chip devices; internal stresses; plastic packaging; reflow soldering; sorption; stress analysis; swelling; thermal stresses; FEA; TGA; autoclave performance; electronic packaging; hygroscopic stress modeling; hygroscopic swelling; leaded packages; moisture conditioning; molded flip chip PBGA; over-molded wire bond PBGA; polymeric materials; solder reflow; substrate based packages; thermal mechanical analysis; thermal stress; thermal-moisture analogy; underfill; Flip chip; Lead; Materials reliability; Moisture; Packaging; Polymers; Semiconductor device modeling; Temperature; Thermal stresses; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-5908-9
Type :
conf
DOI :
10.1109/ECTC.2000.853216
Filename :
853216
Link To Document :
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