• DocumentCode
    2168688
  • Title

    The mechanics and impact of hygroscopic swelling of polymeric materials in electronic packaging

  • Author

    Wong, E.H. ; Chan, K.C. ; Rajoo, R. ; Lim, T.B.

  • Author_Institution
    Inst. of Microelectron., Singapore
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    576
  • Lastpage
    580
  • Abstract
    A reliable technique for characterising the hygroscopic swelling of materials has been developed and used to characterise a number of packaging materials. The hygro-swelling of these materials, though varing in magnitude, exhibits a common behavior in that it increases with temperature and decreases sharply across Tg. Using this data, hygroscopic stress modeling was performed on leaded and substrate based packages. The hygroscopic stress induced through moisture conditioning was found to be significant compared to the thermal stress during solder reflow. Hygroscopic stress in over-molded wire bond PBGA & molded flip chip PBGA was found to be 1.3 to 1.5 times that of thermal stress. Hygroscopic swelling of the underfill in flip chip PBGA was found to be the main failure driver during autoclave test. Autoclave performance of flip chip PBGA package assembled with different underfills & chips was analysed. Excellent correlation was found between autoclave performance and the hygroscopic swelling characteristics of the underfills
  • Keywords
    ball grid arrays; environmental degradation; failure analysis; finite element analysis; flip-chip devices; internal stresses; plastic packaging; reflow soldering; sorption; stress analysis; swelling; thermal stresses; FEA; TGA; autoclave performance; electronic packaging; hygroscopic stress modeling; hygroscopic swelling; leaded packages; moisture conditioning; molded flip chip PBGA; over-molded wire bond PBGA; polymeric materials; solder reflow; substrate based packages; thermal mechanical analysis; thermal stress; thermal-moisture analogy; underfill; Flip chip; Lead; Materials reliability; Moisture; Packaging; Polymers; Semiconductor device modeling; Temperature; Thermal stresses; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-7803-5908-9
  • Type

    conf

  • DOI
    10.1109/ECTC.2000.853216
  • Filename
    853216