DocumentCode
2168744
Title
A Compact System for Systematic Noise Measurement of Schottky Diodes for THz Applications
Author
Biber, S. ; Koca, Ö ; Huber, K. ; Rehm, G. ; Schmidt, L.P.
Author_Institution
Lehrstuhl fÿur Hochfrequenztechnik (LHFT), Universitÿt Erlangen-Nÿurnberg, Cauerstr. 9, D-91058 Erlangen, Germany. phone: +49 9131 8527223, facsimile: +49 9131 8527212, email: stephan@lhft.eei.uni-erlangen.de
fYear
2002
fDate
23-26 Sept. 2002
Firstpage
1
Lastpage
4
Abstract
As Schottky diodes still remain the most frequently used devices in THz mixers, precise evaluation of their DC and noise performance is essential for the improvement of mixers in the sub-millimeter wave regime. We present first results from a measurement system which is able to measure the DC characteristics and the noise for Schottky diodes as a function of frequency and bias current. The automated system is capable of contacting many diodes consecutively.
Keywords
Anodes; Circuit noise; Circulators; Current density; Current measurement; Frequency measurement; Nanopositioning; Noise measurement; Schottky diodes; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 2002. 32nd European
Conference_Location
Milan, Italy
Type
conf
DOI
10.1109/EUMA.2002.339218
Filename
4140298
Link To Document