Title :
Interface adhesion between copper lead frame and epoxy moulding compound: effects of surface finish, oxidation and dimples
Author :
Kim, Jang-Kyo ; Lebbaj, M. ; Liu, Jeff H. ; Kim, Ji Hoon ; Yuen, Matthew M F
Author_Institution :
Dept. of Mech. Eng., Hong Kong Univ. of Sci. & Technol., China
Abstract :
A comprehensive study is made of the effects of dimple and finishing material of copper alloy lead frame on interface adhesion with epoxy moulding compound. The surface plating materials studied include copper alloy, microetched copper, Ag, black oxide coating, Ni, Pd/Ni and Au/Ni plating. Special emphasis was placed on the effects of various stages in manufacturing processes, including post mould cure, thermal cycling, IR reflow and temperature and humidity storage, on the changes in interface adhesion. The interface bond strength was measured using the lead pull test. The lead frame surface was characterized using various techniques, such as atomic force microscopy, X-ray photoelectron spectroscopy, ellipsometry, Raman spectroscopy and contact angle measurements, to correlate the measured interface bond strength with the surface characteristics of various types. It was confirmed that dimples etched on the lead frame surface offered several mechanical anchoring mechanisms and much improved interface bond with moulding compound. The interface bond strength and the number of dimples exhibited roughly a linear relationship. The black oxide and Pd coated surfaces were shown to provide the strongest interface adhesion, with the highest wettability amongst various surface finishes studied. The measurement of contact angle is proved to be an efficient method of evaluating the metal surface quality for interface adhesion with polymer resin
Keywords :
Raman spectra; X-ray photoelectron spectra; adhesion; atomic force microscopy; contact angle; electroplating; ellipsometry; encapsulation; moulding; oxidation; plastic packaging; polymers; reflow soldering; surface mount technology; IR reflow; Raman spectra; X-ray photoelectron spectra; atomic force microscopy; black oxide coating; contact angle; copper alloy; copper lead frame; dimples effect; ellipsometry; encapsulation; epoxy moulding compound; humidity storage; interface adhesion; interface bond strength; lead pull test; mechanical anchoring mechanisms; metal surface quality; microetched copper; number of dimples; oxidation effect; plastic packaging; polymer resin; post mould cure; surface chemistry; surface energy; surface finish effect; surface plating materials; surface roughness; temperature changes; thermal cycling; wettability; Adhesives; Atomic force microscopy; Atomic measurements; Bonding; Copper alloys; Force measurement; Raman scattering; Rough surfaces; Spectroscopy; Surface roughness;
Conference_Titel :
Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-5908-9
DOI :
10.1109/ECTC.2000.853220