Title :
Guidelines for testing WSI sequential arrays
Author :
Buonanno, G. ; Sciuto, D. ; Shen, Y.-N.
Author_Institution :
Dipartimento di Elettronica, Politecnico di Milano, Italy
Abstract :
New results on generating a functional test procedure for linear arrays composed of sequential cells are presented. The sequential cell is modeled as a finite state machine and the testing process is characterized by the definition of a test sequence for each transition of the finite state machine, by means of the unique input/output sequence technique. The two sets of conditions that are defined (for controllability and observability) allow testing of a one-dimensional sequential array in linear time. The methodology presented has been applied to a number of different examples of sequential linear arrays (convolvers, complex multipliers, and FFT arrays), and fault coverage obtained by considering the single stuck-at fault model was evaluated
Keywords :
VLSI; digital integrated circuits; integrated circuit testing; FFT arrays; WSI sequential arrays; complex multipliers; controllability; convolvers; fault coverage; finite state machine; functional test procedure; linear arrays; linear time; observability; one-dimensional sequential array; sequential cells; sequential linear arrays; single stuck-at fault model; test guidelines; Array signal processing; Automata; Computer industry; Computer science; Guidelines; Logic testing; Manufacturing processes; Observability; Pins; Sequential analysis;
Conference_Titel :
Wafer Scale Integration, 1991. Proceedings., [3rd] International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-8186-9126-3
DOI :
10.1109/ICWSI.1991.151731
