Guidelines for testing WSI sequential arrays

New results on generating a functional test procedure for linear arrays composed of sequential cells are presented. The sequential cell is modeled as a finite state machine and the testing process is characterized by the definition of a test sequence for each transition of the finite state machine, by means of the unique input/output sequence technique. The two sets of conditions that are defined (for controllability and observability) allow testing of a one-dimensional sequential array in linear time. The methodology presented has been applied to a number of different examples of sequential linear arrays (convolvers, complex multipliers, and FFT arrays), and fault coverage obtained by considering the single stuck-at fault model was evaluated