• DocumentCode
    2169247
  • Title

    RF MEMS Switch with Wafer Level Package Utilizing Frit Glass Bonding

  • Author

    Fujii, M. ; Kimura, I. ; Satoh, T. ; Imanaka, K.

  • Author_Institution
    Micromachining Lab., Central R&D Lab., OMRON Corporation, Wadai 45, Tsukuba-city, Ibaraki, 300-4247, JAPAN. Tel: +81-(0)298-64-4106, Fax: +81-(0)298-64-3380, Email: fujii@ant.trc.omron.co.jp
  • fYear
    2002
  • fDate
    23-26 Sept. 2002
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    This paper reports experimental results of RF characteristics up to 20 GHz of a RF MEMS switch applied with wafer level packaging. A glass wafer is used as a package substrate on which frit glass is printed as material to seal the MEMS devices. The package wafer is bonded to a device wafer, which consists of actuators and base substrates. The actuators are made of single crystal silicon that has less residual stress. The base substrate has through holes formed by sand blast. The switch achieves a low insertion loss of 1.3 dB and a high isolation of 19 dB up to 20 GHz, and can be mounted on to a circuit board with bumps, like flip chip. The wafer level packaging with low cost and high reliability will transfer RF MEMS devices, which has superior high frequency characteristics even in quasi-millimeter wave band, to the practical use.
  • Keywords
    Actuators; Crystalline materials; Glass; Packaging; Radio frequency; Radiofrequency microelectromechanical systems; Sealing materials; Switches; Wafer bonding; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2002. 32nd European
  • Conference_Location
    Milan, Italy
  • Type

    conf

  • DOI
    10.1109/EUMA.2002.339235
  • Filename
    4140315